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  • SCIENTIFIC & TECHNICAL SERVICES

    X-ray Diffraction Laboratory

  • SCIENTIFIC & TECHNICAL SERVICES

    X-ray Diffraction Laboratory

  • SCIENTIFIC & TECHNICAL SERVICES

    X-ray Diffraction Laboratory

  • SCIENTIFIC & TECHNICAL SERVICES

    X-ray Diffraction Laboratory

  • SCIENTIFIC & TECHNICAL SERVICES

    X-ray Diffraction Laboratory

The X-ray Diffraction Laboratory is a consolidated service of the ICMAB institute. The main objective of the service is to meet the needs of the different departments of the center offering the maximum possible benefits to the institute users and it is also available to external users.

Based on the principles of X-ray diffraction, a wealth of structural and microstructural information about crystalline materials can be derived. In materials science, knowledge of the structure and composition of the materials studied is a key requirement for understanding their properties.

Our fast, accurate and customized services include data collection, qualitative and quantitative phase analysis as well as texture measurements (pole figures), residual stress, reciprocal space maps, etc. The most common function of the service is the acquisition of X-ray diffraction data under different conditions, e.g. by using flat sample and Bragg-Brentano geometry, thin film diffraction, texture determination on layers, microdiffraction and qualitative analysis in capillary materials.

Technicians

Scientists in charge

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Equipment

Siemens D-5000

The Siemens D-5000 is a powder diffractometer well suited for the analysis of powder samples and qualitative analysis. 

The specifications of this diffractometer are:

  • Cu radiaton tube
  • Two arms can move independently
  • Secondary monochromator 
  • Scintillation detector
  • Temperature chamber (Anton Paar TTK 450) with a range between -193ºC to 450ºC (in vacuum conditions).

The applications for this diffractometer are:

  • Standar powder diffraction

 

Bruker D8 Advance (GADDS)

This unit is equipped with a centric Eulerian cradle and a VANTEC-500 area detector. This combination gives the Bruker D8 the capability to handle tasks such as phase identification and quantification, textural and residual stress analysis, determination of particle size, percent crystallinity, and structural identification.

It has this specifications:

  • Cu radiaton tube
  • Göbel Mirror
  • Collimator (0,5 mm, 0,3 mm, 0,1 mm)
  • XYZ stage
  • Vantec 500 Area Detector.

The applications for this diffractometer are:

  • Standard Microdiffraction analysis
  • Stress analysis
  • Texture analysis
  • X-Y mapping of flat samples

Bruker D8-Discover

The D8 DISCOVER is an X-ray diffraction instrument, perfect for thin film application, equipped with four motorized axes stage, having as typical applications: XR Reflectometry, Rocking measurements, RSM measurements and structural phase identification. The equipment can works in two differents configurations, Bragg-Brentano and Parallel configuration. 

The specifications of this diffractometer are:

  • Centric Eulerian Cradle
  • Twin Cu radiaton tube (lineal or point beam)
  • Göbel Mirror 600mm length
  • 2-Bounce monochromator Acc2 (Ge022) primary monochromator
  • Knife Edge Collimator 
  • Lynxeye XE-T Detector
  • Pathfinder 1-Bounce (Ge022) secondary monochromator with scintillation dectector
  • XYZ stage
  • Tilt Stage with Xi Zeta angles

The applications for this difractometer are:

  • High-resolution X-ray diffraction
  • X-ray reflectometry
  • Grazing incidence diffraction (GID)
  • Stress analysis
  • Texture analysis
  • X-Y mapping of flat samples
  • Standard powder diffraction

Bruker D8 Advance A25

The D8 Advance A25 is equipped by two different configurations, Bragg-Brentano geometry with electrochemical cell (Cu radiation) and Debye-Scherrer geometry (Mo radiation) with a Johansson monochromator for capillary measurements.

The specifications are:

  • Cu radiation tube for electro-chemical cell
  • Mo radiaton tube for capillary
  • Johanson primary monochromator for Mo radiation
  • Electro-chemical cell
  • Lynxeye XE-T detector
  • Capillary sample stage
  • Powder sample stage
  • Powder mutliple sample

The applications for this diffractometer are:

  • Standar powder diffraction
  • Capillary diffraction
  • Transmission standard diffraction

Software

Powder Diffraction Software:

EVA – Phase identification and quantitative phase analysis
TOPAS – Profile analysis, quantitative analysis, structure analysis

Materials Research Software:

MULTEX –Texture analysis
LEPTOS – Thin film analysis/Residual stress

X-Ray Diffraction
Service

Address:

ICMAB
Campus UAB
(in front of Firehouse)
08193, Bellaterra
Spain

E-mail:

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