SCIENTIFIC & TECHNICAL SERVICES
Scanning Probe Microscopy Laboratory
The SPM Lab offers SPM related experiments both to the ICMAB community and to external users. We are open to all reserachers at ICMAB who would like to use the SPM equipment for their research and to other researchers from any other research center, university, technological center, spin off or industry.
We are also open to international researchers who would like to do some measurements with us, and researchers who are within the NFFA Europe project initiative.
To request a service, follow the Request Service Form link and we will get in contact with you. You can also contact us by mail if you have any doubts or would like a special request (This email address is being protected from spambots. You need JavaScript enabled to view it. ).
See you at the SPM Lab!

Technicians
Scientist in charge
User's Committee
Equipment

Keysight 5100 AFM (aka Leia)
Keysight 5100 AFM comprises a scanner of 60 x 60 microns in X / Y and 6 microns in the Z axis. The equipment can use a special liquid cell and controlled environment chamber for conducting scanners at low humidity or in nitrogen. The maximum sample size is 3x3 cm in X / Y and 2 cm thick. The equipment works in the Constant Amplitude Dynamic mode for obtaining topographic images, however Contact mode is also a possibility. The equipment uses an external generator module that can apply in-plane magnetic fields upto + -800 Oe. The equipment is specifically employed to acquired topographic images, having a low noise architecture that allow the acquisition of 500 nm size images.

SPM2: Keysight 5500 LS AFM (aka Darth Vader)
Keysight 5500 LS, it has a 90x90 microns in X / Y and 15 microns in the Z axis closed loop scanner. The SPM is equipped with three independent Lock-in amplifiers that can be fully configured through the use of an external Signal Access Box. The equipment can be used with the following modes: Piezoresponse Force Microscopy, Electrostatic Force Microscopy, Kelvin Probe Force Microscopy, Scanning thermal Microscopy (from 2Q2016), Current Sensing Atomic Force Microscopy, PhotoConductive Atomic Force Microscopy, Bimodal Atomic Force Microscopy. It also has Closed Loop capability that significantly improves the positioning in X and Y as well as a motorized stage, with accuracy of + -3 microns, and a range of + -15cm in X / Y and 3cm in Z axis, so sample size may reach up to 25 x 25 cm and 3 cm thick. A Q-Control is also available to enhance images in liquid. It has a separate accessory for measuring humidity and temperature inside SPM box. A sample cooler and heater with a range of -60ºC to 90ºC and a separate heater up to 350ºC can be used in this equipment. A special current-to-voltage amplifier "Resiscope II" from CSI instruments can be used to acquire topography images. A separate accessory for illuminating samples in the Visible and UV spectra is also available.

SPM3: Keysight 5500 AFM (aka Luke)
Keysight 5500, it has a 90x90 microns in X / Y and 15 microns in the Z axis closed loop scanner. The SPM is equipped with three independent Lock-in amplifiers that can be fully configured through the use of an external Signal Access Box. The equipment can be used with the following modes: Piezoresponse Force Microscopy, Bimodal Atomic Force Microscopy and Dynamic Topography. It also has aClosed Loop capability that significantly improves the positioning in X and Y. Sample size is limited to 3 x 3 cm in the X and Y directions and 1 cm in the Z direction. A Q-Control is also available to enhance images in liquid. It has a separate accessory for measuring humidity and temperature inside SPM box. A separate heater up to 350ºC can be used in this equipment.

SPM4: Nanotech Cervantes (aka Jabba)
Nanotec Cervantes FullMode SPM System is a modular, open and versatile microscope, designed not only for obtaining the highest quality images, but also for those applications that require a characterization of other physical properties of your sample. Currently we use this equipment for topography, and as a separate equipment for nano positioning systems.

Open for NFFA Project
We are open to possible new requests through the EU project NFFA.
AFM Images Gallery
Scanning Probe Microscopy
Address:
ICMAB
Campus UAB
08193, Bellaterra
Spain
E-mail:
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