Piezo-generated charge mapping revealed through direct piezoelectric force microscopy

Piezo-generated charge mapping revealed through direct piezoelectric force microscopy

Scientific Highlights Materials for information science and electronics 24 October 2017 1659 hits jags
A. GomezM. GichA. Carretero-GenevrierT. Puig & X. Obradors Nature Communications 8, Article number: 1113 (2017) doi:10.1038/s41467-017-01361-2

While piezoelectric and ferroelectric materials play a key role in many everyday applications, there are still a number of open questions related to their physics. To enhance our understanding of piezoelectrics and ferroelectrics, nanoscale characterization is essential. Here, we develop an atomic force microscopy based mode that obtains a direct quantitative analysis of the piezoelectric coefficient d33. We report nanoscale images of piezogenerated charge in a thick single crystal of periodically poled lithium niobate (PPLN), a bismuth ferrite (BiFO3) thin film, and lead zirconate titanate (PZT) by applying a force and recording the current produced by these materials. The quantification of d33coefficients for PPLN (14 ± 3 pC per N) and BFO (43 ± 6 pC per N) is in agreement with the values reported in the literature. Even stronger evidence of the reliability of the method is provided by an equally accurate measurement of the significantly larger d33 of PZT.

See more posts on ICMAB related to: A. Gomez , M. Gich , A. Carretero-Genevrier , T. Puig , X. Obradors

Related Topics: Materials for information science and electronics

Also on ICMAB...


Your experience on this site will be improved by allowing cookies Cookie Settings